Advances in x-ray diffractometry and x-ray spectrography : a volume of fifteen selected reprints from Philips Laboratories, Irvington-on-Hudson, N.Y., U.S.A. / ed. by W. Parrish.

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Agricultural Physics General Stacks	537.5352 (Browse shelf(Opens below))	Available		APL995

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