Advances in x-ray diffractometry and x-ray spectrography : a volume of fifteen selected reprints from Philips Laboratories, Irvington-on-Hudson, N.Y., U.S.A. / ed. by W. Parrish.
Material type:
TextPublication details: Eindhoven, Holland : Centrex Pub. Co., 1962.Subject(s): DDC classification: - 537.5352
| Item type | Current library | Call number | Status | Date due | Barcode |
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Books
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Agricultural Physics General Stacks | 537.5352 (Browse shelf(Opens below)) | Available | APL995 |
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