Advances in x-ray diffractometry and x-ray spectrography :

Parrish, William,

Advances in x-ray diffractometry and x-ray spectrography : a volume of fifteen selected reprints from Philips Laboratories, Irvington-on-Hudson, N.Y., U.S.A. / ed. by W. Parrish. - Eindhoven, Holland : Centrex Pub. Co., 1962.


Spectrographs, X-Ray.
X-ray crystallography.

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