Physical aspects of electron microscopy & microbeam analysis edited by B.M. Siegel and D.R. Beaman
Publication details: New York John Wiley and Sons 1975Description: 474 pSubject(s):Item type | Current library | Call number | Status | Date due | Barcode |
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Books | Prof. M S Swaminathan Library, ICAR: Indian Agricultural Research Institute | 537.533.72 S 571 P (Browse shelf(Opens below)) | Available | 142731 |
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537.533.72 S 571 M Modern development in electron microscopy | 537.533.72 S 571 M Modern developments in electron microscopy | 537.533.72 S 571 P Physical aspects of electron microscopy & microbeam analysis | 537.533.72 S 571 P Physical aspects of electron microscopy & microbeam analysis | 537.533.72 S 63 Scanning tunneling microsocopy | 537.533.72 S 844 E Experimental high-resolution electron microscopy | 537.533.72 S 948 W World through the electron microscope |
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