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Physical aspects of electron microscopy & microbeam analysis

Physical aspects of electron microscopy & microbeam analysis edited by B.M. Siegel and D.R. Beaman - New York John Wiley and Sons 1975 - 474 p.

Subjects--Topical Terms:
Electron Microscopy

Universal Decimal Class. No.: 537.533.72 / S 571 P

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Physical aspects of electron microscopy & microbeam analysis