000 00429 a2200133 4500
080 _a539.25:537.56
_bM 958 F
245 1 _aField ion microscopy
_bPrinciples & applications
_cby E.W. Muller and T.T. Tsong
260 _aNew York
_bAmerican Elsevier Pub. Co.
_c1969
650 _aField Ion Microscopy
100 1 _aMuller, E.W., Tsong, T.T.
300 _a314 p.
040 _aIARI, New Delhi
901 _a125860
999 _c67732
_d67732