| 000 | 00428 a2200145 4500 | ||
|---|---|---|---|
| 080 |
_a537.533.72 _bS 571 P |
||
| 245 | 1 |
_aPhysical aspects of electron microscopy & microbeam analysis _cedited by B.M. Siegel and D.R. Beaman |
|
| 260 |
_aNew York _bJohn Wiley and Sons _c1975 |
||
| 650 | _aElectron Microscopy | ||
| 700 | _aSiegel, B.M., ed. | ||
| 700 | _aBeaman, D.R., ed. | ||
| 100 |
_a _d |
||
| 300 | _a474 p. | ||
| 901 | _a142731 | ||
| 999 |
_c67637 _d67637 |
||