000 00484 a2200169 4500
080 _a541.18:543/545
_bM 984 P
245 1 _aPhysical measurement and analysis of thin films
_cedited by E.M. Murt and W.G. Guldner
260 _aNew York
_bPlenum Press
_c1969
650 _aAnalysis
650 _aThin Films
700 _aMurt, E.M., ed.
700 _aGuldner, W.G., ed.
440 _aVol. II
_vProgress in analytical chemistry
100 _a
_d
300 _a194 p.
901 _a107179
999 _c26708
_d26708