000 01452cas a22003737a 4500
001 11818463
003 IARI
005 20140224165056.0
006 m q d
007 co cgu
008 991025c19979999pauar q 1 0eng c
010 _asn 97004900
016 7 _a2250732-2
_2DE-600
022 _a1097-0002
035 _a(OCoLC)ocm38001848
037 _bInternational Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA 19073-3273
040 _aNSDP
_beng
_cNSDP
_dOCoLC
_dHkUST
_dOCoLC
_dDLC
_dOCoLC
_dHEBIS
_dOCoLC
_dCU-S
042 _apcc
082 1 0 _a539
111 2 _aConference on Application of X-ray Analysis.
210 0 _aAdv. X-ray anal.
222 0 _aAdvances in X-ray analysis
240 1 0 _aAdvances in X-ray analysis
245 1 0 _aAdvances in X-ray analysis
_bproceedings of the 6th annual Conference on Application of X-ray Analysis.
260 _aLondon :
_bSir Isaac pitman n sons
300 _a359 p.
362 0 _aVol. 1
650 0 _aX-rays
_xIndustrial applications
_vCongresses.
776 0 8 _iOnline version:
_aConference on Application of X-ray Analysis.
_tAdvances in x-ray analysis
_w(OCoLC)696038265
780 0 0 _aConference on Application of X-ray Analysis.
_tAdvances in x-ray analysis
_x0376-0308
_w(DLC) 82642132
_w(OCoLC)1461274
942 _2ddc
_cB
999 _c160612
_d160612