000 | 00435nam a2200133Ia 4500 | ||
---|---|---|---|
008 | 130225s9999 xx 000 0 und d | ||
080 |
_a537.533.72 _bS63 |
||
100 | _aKalinin, Segei and Gruverman, Alexei, ed | ||
245 | _aScanning probe microscopy: Electrical and electromechanical phenomena at the nan | ||
260 |
_aNew York _bSpringer Science + Business Media _c2007 |
||
300 | _a980p. | ||
901 | _a245329 245330 | ||
942 |
_cB _2udc |
||
999 |
_c15119 _d15119 |