000 00435nam a2200133Ia 4500
008 130225s9999 xx 000 0 und d
080 _a537.533.72
_bS63
100 _aKalinin, Segei and Gruverman, Alexei, ed
245 _aScanning probe microscopy: Electrical and electromechanical phenomena at the nan
260 _aNew York
_bSpringer Science + Business Media
_c2007
300 _a980p.
901 _a245329 245330
942 _cB
_2udc
999 _c15119
_d15119