Physical aspects of electron microscopy & microbeam analysis edited by B.M. Siegel and D.R. Beaman
Publication details: New York John Wiley and Sons 1975Description: 474 pSubject(s):| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
|
Prof. M S Swaminathan Library, ICAR: Indian Agricultural Research Institute | 537.533.72 S 571 P (Browse shelf(Opens below)) | Available | 142806 |
Browsing Prof. M S Swaminathan Library, ICAR: Indian Agricultural Research Institute shelves Close shelf browser (Hides shelf browser)
| No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | ||
| 537.533.72 S 479 F Focusing of charged particles | 537.533.72 S 571 M Modern development in electron microscopy | 537.533.72 S 571 M Modern developments in electron microscopy | 537.533.72 S 571 P Physical aspects of electron microscopy & microbeam analysis | 537.533.72 S 571 P Physical aspects of electron microscopy & microbeam analysis | 537.533.72 S 63 Scanning tunneling microsocopy | 537.533.72 S 844 E Experimental high-resolution electron microscopy |
There are no comments on this title.