World through the electron microscope compiled by E. Suito
Publication details: Japan Japan Electron Optics Laboratory Co. Ltd. 1969Description: 132 pSubject(s):| Item type | Current library | Call number | Status | Date due | Barcode |
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Books
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Prof. M S Swaminathan Library, ICAR: Indian Agricultural Research Institute | 537.533.72 S 948 W (Browse shelf(Opens below)) | Available | 104384 |
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| 537.533.72 S 571 P Physical aspects of electron microscopy & microbeam analysis | 537.533.72 S 63 Scanning tunneling microsocopy | 537.533.72 S 844 E Experimental high-resolution electron microscopy | 537.533.72 S 948 W World through the electron microscope | 537.533.72 S63 Scanning probe microscopy: Electrical and electromechanical phenomena at the nan | 537.533.72 S63 Scanning probe microscopy: Electrical and electromechanical phenomena at the nan | 537.533.72 T 514 S Scanning electron microscopy |
IV : Chemistry
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