Scanning probe microscopy: Electrical and electromechanical phenomena at the nan
Material type: TextPublication details: New York Springer Science + Business Media 2007Description: 980pItem type | Current library | Call number | Vol info | Status | Date due | Barcode |
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Books | Prof. M S Swaminathan Library, ICAR: Indian Agricultural Research Institute | 537.533.72 S63 (Browse shelf(Opens below)) | Available | 245329 | ||
Books | Prof. M S Swaminathan Library, ICAR: Indian Agricultural Research Institute | 537.533.72 S63 (Browse shelf(Opens below)) | Available | 245330 |
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537.533.72 S 844 E Experimental high-resolution electron microscopy | 537.533.72 S 948 W World through the electron microscope | 537.533.72 S63 Scanning probe microscopy: Electrical and electromechanical phenomena at the nan | 537.533.72 S63 Scanning probe microscopy: Electrical and electromechanical phenomena at the nan | 537.533.72 T 514 S Scanning electron microscopy | 537.533.72 T 681 I Introduction to microscopy by means of light, electrons, xray, or ultrasound | 537.533.72 V 946 E Electron microscopy of materials |
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