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Field ion microscopy

Muller, E.W., Tsong, T.T.

Field ion microscopy Principles & applications by E.W. Muller and T.T. Tsong - New York American Elsevier Pub. Co. 1969 - 314 p.

Subjects--Topical Terms:
Field Ion Microscopy

Universal Decimal Class. No.: 539.25:537.56 / M 958 F

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Field ion microscopy