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Physical measurement and analysis of thin films

Physical measurement and analysis of thin films edited by E.M. Murt and W.G. Guldner - New York Plenum Press 1969 - 194 p. - Vol. II Progress in analytical chemistry .

Subjects--Topical Terms:
Analysis
Thin Films

Universal Decimal Class. No.: 541.18:543/545 / M 984 P

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Physical measurement and analysis of thin films