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Scanning probe microscopy: Electrical and electromechanical phenomena at the nan

Kalinin, Segei and Gruverman, Alexei, ed

Scanning probe microscopy: Electrical and electromechanical phenomena at the nan - New York Springer Science + Business Media 2007 - 980p.

Universal Decimal Class. No.: 537.533.72 / S63

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ICAR-Indian Agricultural Research Library

Scanning probe microscopy: Electrical and electromechanical phenomena at the nan